Tektronix P7313 Differential Probe, Advanced Measurement Tool for Precision Electronics Testing
The Tektronix P7313 Differential Probe is an essential tool for oscilloscope users requiring high-precision measurements in noisy environments. Designed for accurate voltage difference measurement between two points, it offers a bandwidth of up to 1.5 GHz, making it ideal for engineers and technicians working with high-frequency signals.
Brand:Tektronix
Model:P7313
Type:Differential Probe
Bandwidth:2 GHz
Max Voltage:±800 V
Probe Tip:1x/10x switchable
Input Impedance:10 MΩ
Attenuation Ratio:10:1
Connector Type:BNC
Operating Temperature:-10°C to +50°C
The Tektronix P7313 Differential Probe is an essential tool for anyone working with industrial control systems. Designed with precision in mind, this differential probe offers a bandwidth of up to 1.5 GHz, ensuring it can handle even the most demanding measurement scenarios. With a max input voltage of 800V, it provides the safety and reliability needed when dealing with high-voltage circuits.
Featuring a 50X attenuation ratio, the P7313 allows for accurate voltage measurements in noisy environments without sacrificing precision. Its dual-channel differential probing capabilities make it ideal for comparing voltages across two points, providing engineers with the data they need to diagnose issues and optimize system performance.
Built with robust materials, this probe is built to last, ensuring reliable performance over time. Its compact design and user-friendly interface make it easy to integrate into existing setups, saving valuable time during installation and setup.
For those working in noisy environments, the Tektronix P7313 offers superior common mode rejection ratio (CMRR) of >100 dB, allowing for clean and accurate measurements even in challenging conditions. With a noise level of less than 2 µVrms, it ensures minimal interference and maximum accuracy.
With a slew rate of ≥1000 V/ns, this probe can capture fast-changing signals with ease, making it an invaluable tool for testing and debugging complex electronic systems.
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